ANLAGE ZUM UEBERSPIELEN AUF MAGNETTON-RANDSPUR BEI GLEICHZEITIGER KONTROLLE DES SYNCHRONISMUS. = DISPOSITIF POUR LA REPRODUCTION DU SON SUR PISTE SONORE AVEC CONTROLE SIMULTANE DU SYNCHRONISMEWUCHER A.1976; FERNSCH-U. KINO-TECH.; DTSCH.; DA. 1976; VOL. 30; NO 2; PP. 52-54; ABS. ANGL. FR. ESP.; BIBL. 1 REF.Article

LICHTTON-UMSPIELANLAGE MIT DOLBY-SYSTEM. = SON OPTIQUE - INSTALLATION DE REENREGISTREMENT AVEC UN SYSTEME DOLBYWUCHER A.1974; FERNSEH- U. KINO-TECH.; DTSCH.; DA. 1974; VOL. 28; NO 9; PP. 265-267; ABS. ANGL. FR. ESP.; BIBL. 4 REF.Article

ALTERNATIVE ZUR LOESUNG DER SYNCHRONSTUDIO-AUFGABEN. = POSSIBILITES DE RESOUDRE LES TACHES SE PRESENTANT DANS LES STUDIOS DE SYNCHRONISATIONWUCHER A.1977; BILD U. TON; DTSCH.; DA. 1977; VOL. 30; NO 3; PP. 84-88Article

Plasma studies on the Leybold-Heraeus INA3 secondary neutral mass spectrometry systemWUCHER, A.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1988, Vol 6, Num 4, pp 2293-2298, issn 0734-2101Article

QUANTITATIVE ANALYSIS OF THIN OXIDE LAYERS ON TANTALUM BY SPUTTERED NEUTRAL MASS SPECTROMETRY (SNMS) = ANALYSE QUANTITATIVE DE COUCHES FINES D'OXYDE SUR LE TANTALE PAR SPECTROMETRIE DE MASSE NEUTRE AVEC PULVERISATION (SNMS)OECHSNER H; WUCHER A.1982; APPL. SURF. SCI.; ISSN 0378-5963; NLD; DA. 1982; VOL. 10; NO 3; PP. 342-348; BIBL. 11 REF.Article

Surface and thin film analysis with Electron and Mass spectrometric techniquesWUCHER, A.Materials science forum. 1998, pp 61-84, issn 0255-5476, isbn 0-87849-815-XConference Paper

Laterally resolved chemical analysis of solid surfaces by laser-SNMSBERTHOLD, W; WUCHER, A.Surface and interface analysis. 1995, Vol 23, Num 6, pp 393-398, issn 0142-2421Article

Sputtering of silver dimers : a molecular dynamics calculation using a many-body embedded-atom potentialWUCHER, A; GARRISON, B. J.Surface science. 1992, Vol 260, Num 1-3, pp 257-266, issn 0039-6028Article

Low-energy electronic excitation in atomic collision cascades : A nonlinear transport modelDUVENBECK, A; WUCHER, A.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 16, pp 165408.1-165408.9, issn 1098-0121Article

Unimolecular decomposition in the sputtering of metal clustersWUCHER, A; GARRISON, N. J.Physical review. B, Condensed matter. 1992, Vol 46, Num 8, pp 4855-4864, issn 0163-1829Article

Electron impact ionization of small silver and copper clustersFRANZREB, K; WUCHER, A; OECHSNER, H et al.Zeitschrift für Physik. D, atoms, molecules and clusters. 1990, Vol 17, Num 1, pp 51-56, issn 0178-7683, 6 p.Article

Sputtering of indium using Au_m projectiles : Transition from linear cascade to spike regimeSAMARTSEV, A. V; DUVENBECK, A; WUCHER, A et al.Physical review B. Condensed matter and materials physics. 2005, Vol 72, Num 11, pp 115417.1-115417.10, issn 1098-0121Article

Relative elements sensitivity factors in secondary neutral mass spectrometryWUCHER, A; NOVAK, F; REUTER, W et al.Journal of vacuum science and technology. A. Vacuum, surfaces, and films. 1988, Vol 6, Num 4, pp 2265-2270, issn 0734-2101Article

Three-dimensional depth profiling of molecular structuresWUCHER, A; CHENG, J; ZHENG, L et al.Analytical & bioanalytical chemistry (Print). 2009, Vol 393, Num 8, pp 1835-1842, issn 1618-2642, 8 p.Conference Paper

High-frequency electron-gas secondary neutral mass spectrometry : Evaluation of transient effectsKRIMKE, R; URBASSEK, H. M; WUCHER, A et al.Journal of physics. D, Applied physics (Print). 1997, Vol 30, Num 11, pp 1676-1682, issn 0022-3727Article

Formation of secondary cluster ions during sputtering of silver and copperFRANZREB, K; WUCHER, A; OECHSNER, H et al.Physical review. B, Condensed matter. 1991, Vol 43, Num 18, pp 14396-14399, issn 0163-1829Article

Formation of neutral and positively charged clusters (Ag_n and Ag_n⁺; n≤4) during sputtering of silverFRANZREB, K; WUCHER, A; OECHSNER, H et al.Surface science. 1992, Vol 279, Num 3, pp L225-L230, issn 0039-6028Article

Saturation and fragmentation in non resonant laser postionization of sputtered atoms and moleculesFRANZREB, K; WUCHER, A; OECHSNER, H et al.Fresenius' journal of analytical chemistry. 1991, Vol 341, Num 1-2, pp 7-11, issn 0937-0633Conference Paper

Kinetic electron excitation in atomic collision cascadesMEYER, S; DIESING, D; WUCHER, A et al.Physical review letters. 2004, Vol 93, Num 13, pp 137601.1-137601.4, issn 0031-9007Article

Absolute depth profiling of thin film systems by low energy secondary neutral mass spectrometry = Profil de profondeur absolu des systèmes de couches minces par spectrométrie de masse neutre secondaire à basse énergieWUCHER, A; OECHSNER, H; NOVAK, F et al.Thin solid films. 1989, Vol 174, Num 1-2, pp 133-137, issn 0040-6090Conference Paper

Investigations of molecular depth profiling with dual beam sputteringLU, C; WUCHER, A; WINOGRAD, N et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 175-177, issn 0142-2421, 3 p.Conference Paper

Relative elemental sensitivity factors in non-resonant laser-SNMSWAHL, M; KOCH, D; BERTHOLD, W et al.Fresenius' journal of analytical chemistry. 1995, Vol 353, Num 3-4, pp 354-359, issn 0937-0633Conference Paper

Ionization probabilities of sputtered indium atoms under atomic and polyatomic Aum ion bombardmentSAMARTSEV, A. V; HEUSER, C; WUCHER, A et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 87-89, issn 0142-2421, 3 p.Conference Paper

On the role of molecular photofragmentation during depth profiling of tantalum oxide layers by laser SNMSWUCHER, A; FRANZREB, K; MATHIEU, H.-J et al.Surface and interface analysis. 1995, Vol 23, Num 12, pp 844-848, issn 0142-2421Article

Yields of sputtered metal clusters : the influence of surface structureWUCHER, A; MA, Z; CALAWAY, W. F et al.Surface science. 1994, Vol 304, Num 1-2, pp L439-L444, issn 0039-6028Article